1032_SYSTEM-ON-CHIP TESTING
Course Period：From2015-03-02 ~ Any Time
Course Intro
Course Plan
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00_Overview
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01_Introduction
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02_Faul model
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03_Faul simulation
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04_Test generation
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05_Testability Analysis
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06_Design for testability
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07_BIST
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08_Memory testing
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Final Examination
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Final Examination_ref
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HW1
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HW2
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HW3
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HW4
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HW5
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HW6
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Midterm Examination_ref
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SOCT_Score
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小考
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期末專題第一次報告
Co-Instructor(s)
謝東佑
謝東佑
Co-Instructor(s)
彭依涵
彭依涵
Co-Instructor(s)
陳勁儒
陳勁儒
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