1032_SYSTEM-ON-CHIP TESTING
Course Period：From2015-03-02 ~ Any Time
Course Intro
Course Plan
-
00_Overview
-
01_Introduction
-
02_Faul model
-
03_Faul simulation
-
04_Test generation
-
05_Testability Analysis
-
06_Design for testability
-
07_BIST
-
08_Memory testing
-
Final Examination
-
Final Examination_ref
-
HW1
-
HW2
-
HW3
-
HW4
-
HW5
-
HW6
-
Midterm Examination_ref
-
SOCT_Score
-
小考
-
期末專題第一次報告
Co-Instructor(s)
謝東佑
謝東佑
Co-Instructor(s)
彭依涵
彭依涵
Co-Instructor(s)
陳勁儒
陳勁儒
Related Courses
|
|
||||||
|
|
|
||||||
|
|
|
||||||
|