1042_SYSTEM-ON-CHIP TESTING PRACTICE
Course Period:From2016-02-23 ~ Any Time
Course Intro
Course Plan
-
00_Overview
-
01_Coding style evaluation
-
02_Testability analysis and enhancement
-
03_Timing analysis
-
04_Scan chain insertion
-
05_Fault simulation
-
06_ATPG and fault coverage enhancement
-
07_Test quality enhancement
-
08_Test power analysis and reduction
-
09_ATPG Efficiency Enhancement and Test Set Size Reduction
-
10_Test automation
-
11_Diagnosis
-
CIC_Timing analysis
-
Final_project
-
HW1
-
HW3
-
Hw2
-
LAB10_2_Files
-
La11_files
-
Lab1-file
-
Lab10_files
-
Lab2-file
-
Lab3-file
-
Lab4_files
-
Lab5_files
-
Lab6_files
-
Lab7_files
-
Lab8_Files
-
Lab9_files
-
SOCTP_ALL_Score
-
Workstation-operation-flow
-
soctp_Score
Co-Instructor(s)
謝東佑
謝東佑
Co-Instructor(s)
鄭冠之
鄭冠之