1042_SYSTEM-ON-CHIP TESTING PRACTICE
Course Period:From2016-02-23 ~ Any Time
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Course Intro

Course Plan

  • 00_Overview
  • 01_Coding style evaluation
  • 02_Testability analysis and enhancement
  • 03_Timing analysis
  • 04_Scan chain insertion
  • 05_Fault simulation
  • 06_ATPG and fault coverage enhancement
  • 07_Test quality enhancement
  • 08_Test power analysis and reduction
  • 09_ATPG Efficiency Enhancement and Test Set Size Reduction
  • 10_Test automation
  • 11_Diagnosis
  • CIC_Timing analysis
  • Final_project
  • HW1
  • HW3
  • Hw2
  • LAB10_2_Files
  • La11_files
  • Lab1-file
  • Lab10_files
  • Lab2-file
  • Lab3-file
  • Lab4_files
  • Lab5_files
  • Lab6_files
  • Lab7_files
  • Lab8_Files
  • Lab9_files
  • SOCTP_ALL_Score
  • Workstation-operation-flow
  • soctp_Score
Co-Instructor(s)
謝東佑
Co-Instructor(s)
鄭冠之

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