1052_SYSTEM-ON-CHIP TESTING
Course Period：From2017-02-21 ~ Any Time
Course Intro
Course Plan
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00_Overview
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01_Introduction
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02_Faul model
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03_Faul simulation
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04_Test generation
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04_Test generation_animation
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05_Testability Analysis
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05_Testability Analysis
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06_Design for testability
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07_BIST
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08_Memory testing
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EX1 files
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EX1_Fault simulation
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EX2_ATPG
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EX2_files
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Final Examination_ref
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FinalExam_Ans
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FinalExam_Score
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HW1_Ans
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HW1_Score
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HW2_Ans
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HW2_Score
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HW3_Ans
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HW3_Score
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HW4_Ans
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HW4_Score
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HW5_Ans
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HW5_Score
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Midterm Examination_ref
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Midterm_Score
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Workstation-operation-flow
Co-Instructor(s)
謝東佑
謝東佑
Co-Instructor(s)
王致皓
王致皓
Co-Instructor(s)
林劻錞
林劻錞
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