1072_系統晶片測試
上課期間：從 2019-02-21 到 無限期
課程介紹
課程安排
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00_Overview
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01_Introduction
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02_Faul model
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03_Faul simulation
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04_Test generation
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04_Test generation_animation
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05_Testability Analysis
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05_Testability Analysis
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06_Design for testability
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07_BIST
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08_Memory testing
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EX1 files
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EX1_Fault simulation
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EX1成績
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EX2_ATPG
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EX2_files
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EX2成績
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EX3_Scan-Insertion&ATPG
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EX3_files
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Final Examination_ans
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Final Examination_ref
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HW1成績(更新)
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HW1解答
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HW2成績
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HW2解答
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HW3成績
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HW3解答
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HW4成績
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HW4解答
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Homework1
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Homework2
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Homework3
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Homework4
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Introduction to Workstation
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Midterm Examination_ref
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score_summary
教師 / 謝東佑
教師 / 林昕嫻
教師 / 邱育仁
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