1091_SYSTEM-ON-CHIP TESTING
Registration：FromNow ~ Any Time
Course Period：FromNow ~ Any Time
Course Intro
Course Plan
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00_Overview
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01_Introduction
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02_Faul model
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03_Faul simulation
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04_Test generation
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04_Test generation_animation
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05_Testability Analysis
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05_Testability Analysis
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06_Design for testability
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07_BIST
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08_Memory testing
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EX1_Fault simulation
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EX2_ATPG
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EX3_Scan-Insertion&ATPG
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03-1_Introduction to Workstation Environment
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03-II_Workstation-operation-flow
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04_Test generation_animation
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Homework1
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Homework2
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Homework3
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Homework4
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Midterm Examination_ref
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04_Test generation_animation
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PODEM-exe_ref-ans
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D-Algorithm-exe_ref-ans
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EX1_files
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EX1_Fault-simulation
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EX2_ATPG
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EX2_files
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EX1_EX2_upload_info
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SOC-Server-Overview
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Homework5
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Final Examination_ref
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HW5_Ans
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109-1 SOCT成績
Co-Instructor(s)
謝東佑
謝東佑
Co-Instructor(s)
吳閏琮
吳閏琮
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