1131_SYSTEM-ON-CHIP TESTING_IICD504
Course Period:FromNow ~ Any Time
LINE sharing feature only supports mobile devices

Course Intro

Course Plan

  • 00_Overview
  • test_operation_worksheet
  • 113-1 SOCT 工作站帳號密碼
  • 01_Introduction
  • Homework Rule
  • 02_Fault model
  • 03_Faul simulation 1
  • Homework1
  • Midterm Examination_ref
  • 04_Test generation
  • Homework2
  • EX1_Fault simulation
  • D-Algorithm Worksheet (In Class)
  • D-Algorithm Worksheet (After Class)
  • Homework3
  • PODEM_worksheet
  • PODEM_worksheet_after_class
  • 05_Testability Analysis
  • 06_Design for testability
  • 07_BIST
  • Seq_test_generation_worksheet
  • Homework4
  • SCOAP_worksheet
  • test_operation_worksheet
  • Homework5_v2
  • Final Examination_ref
  • EX2_ATPG_v2
  • EX3_Scan-Insertion_ATPG_v2
  • final_exam_classroom
Co-Instructor(s)
謝東佑
Co-Instructor(s)
甄致瑜
Co-Instructor(s)
黃柏愷
Co-Instructor(s)
廖國宏
Co-Instructor(s)
吳閏琮

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LINE sharing feature only supports mobile devices