1011_系統晶片測試
上課期間：從 2012-09-19 到 無限期
課程介紹
課程安排
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00_Overview
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01_Introduction
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02_Faul model
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03_Faul simulation
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04_Test generation
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05_Testability Analysis
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06_Design for testability
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07_BIST
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08_Memory testing
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09_Fault-tolerant design
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10_Board&System-level testing
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20121227
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Assitsant_01_Introduction to Workstation
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Assistant_02_Fault simulation
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Assistant_03_ATPG
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Final Examination_ref1
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Final Examination_ref2
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Grade
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Grade_HW1
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Grade_HW4
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HW1_Fault simulation
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HW1_reference_answer
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HW2_ATPG
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HW2_reference_answer
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HW3_Testability Analysis
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HW3_reference_answer
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HW4_Scan-Insertion&ATPG
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HW4_reference_answer
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Midterm Examination_ref
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SCOAP_Testability Analysis
教師 / 謝東佑
教師 / 紀雅修
教師 / 高天財
教師 / 顧家齊
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