1021_系統晶片測試
報名期間：從 即日起 到 無限期
上課期間：從 2013-09-23 到 無限期
課程介紹
課程安排
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00_Overview
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01_Introduction
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02_Faul model
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03_Faul simulation
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04_Test generation
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05_Testability Analysis
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06_Design for testability
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07_BIST
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08_Memory testing
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09_Board&System-level testing
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Exercise
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Final Examination_ref
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HW1_Fault simulation
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HW1_Fault simulation_new
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HW2_ATPG
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HW3_Testability Analysis
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HW4_Scan-Insertion&ATPG
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Midterm Examination_ref
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SOCTesting_final_ref
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SOCTesting_part1
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SOCTesting_part2
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SOCTesting_part3
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SOCTesting_part4
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Score_ALL
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Score_ALL
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Score_Final
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Score_HW1
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Score_HW2
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Score_HW3
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Score_HW4
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Score_Midterm
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Workstation_Account
教師 / 謝東佑
教師 / 李冠賢
教師 / 郭俊緯
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