1021_SYSTEM-ON-CHIP TESTING
Registration:FromNow ~ Any Time
Course Period:From2013-09-23 ~ Any Time
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Course Intro

Course Plan

  • 00_Overview
  • 01_Introduction
  • 02_Faul model
  • 03_Faul simulation
  • 04_Test generation
  • 05_Testability Analysis
  • 06_Design for testability
  • 07_BIST
  • 08_Memory testing
  • 09_Board&System-level testing
  • Exercise
  • Final Examination_ref
  • HW1_Fault simulation
  • HW1_Fault simulation_new
  • HW2_ATPG
  • HW3_Testability Analysis
  • HW4_Scan-Insertion&ATPG
  • Midterm Examination_ref
  • SOCTesting_final_ref
  • SOCTesting_part1
  • SOCTesting_part2
  • SOCTesting_part3
  • SOCTesting_part4
  • Score_ALL
  • Score_ALL
  • Score_Final
  • Score_HW1
  • Score_HW2
  • Score_HW3
  • Score_HW4
  • Score_Midterm
  • Workstation_Account
Co-Instructor(s)
謝東佑
Co-Instructor(s)
李冠賢
Co-Instructor(s)
郭俊緯

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