1032_系統晶片測試技術實務

上課期間：從 2015-03-02 到無限期

課程介紹

課程安排

00_Overview

01_Coding style evaluation

02_Testability analysis and enhancement

03_Timing analysis

04_Scan chain insertion

05_ATPG and fault coverage enhancement

06_Test quality enhancement

07_Test power analysis and reduction

08_ATPG Efficiency Enhancement and Test Set Size Reduction

09_Test automation

10_Diagnosis

2015-06-10 IC Test Challenges and Opportunities

Final_project

Lab1-file

Lab2-file

Lab3-file

Lab4-file

Lab5-file

Lab7-file

Lab8_random

SOCTP_Score

Score_hw1

Score_hw2

Workstation-operation-flow

divider

lab6

lab8_file

nWave

synopsys_pt

期末專題第一次報告

教師 / 謝東佑

教師 / 彭依涵

教師 / 陳勁儒