1032_SYSTEM-ON-CHIP TESTING PRACTICE
Course Period：From2015-03-02 ~ Any Time
Course Intro
Course Plan
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00_Overview
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01_Coding style evaluation
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02_Testability analysis and enhancement
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03_Timing analysis
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04_Scan chain insertion
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05_ATPG and fault coverage enhancement
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06_Test quality enhancement
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07_Test power analysis and reduction
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08_ATPG Efficiency Enhancement and Test Set Size Reduction
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09_Test automation
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10_Diagnosis
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2015-06-10 IC Test Challenges and Opportunities
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Final_project
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Lab1-file
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Lab2-file
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Lab3-file
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Lab4-file
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Lab5-file
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Lab7-file
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Lab8_random
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SOCTP_Score
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Score_hw1
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Score_hw2
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Workstation-operation-flow
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divider
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lab6
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lab8_file
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nWave
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synopsys_pt
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期末專題第一次報告
Co-Instructor(s)
謝東佑
謝東佑
Co-Instructor(s)
彭依涵
彭依涵
Co-Instructor(s)
陳勁儒
陳勁儒
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