1042_系統晶片測試
上課期間：從 2016-02-23 到 無限期
課程介紹
課程安排
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01_Introduction
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02_Faul model
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03_Faul simulation
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04_Test generation
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04_Test generation_animation
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05_Testability Analysis
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05_Testability Analysis
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06_Design for testability
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07_BIST
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08_Memory testing
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09_Board&System-level testing
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104_2 SOC Testing Midterm_ref solution
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104_2_SOC_Testing_Score
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10_Fault-tolerant design
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EX1 files
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EX1_Fault simulation
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EX2_ATPG
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EX2_files
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EX3_Scan-Insertion&ATPG
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EX3_files
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Exercise
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Final Examination
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Final Examination_ref
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HW1_ref-sol
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HW2_Ans
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HW3_Ans
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HW4_Ans
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HW5_Ans
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HW6_Ans
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Midterm Examination_ref
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Midterm_Score
教師 / 謝東佑
教師 / 王致皓
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