1042_SYSTEM-ON-CHIP TESTING
Course Period：From2016-02-23 ~ Any Time
Course Intro
Course Plan
-
01_Introduction
-
02_Faul model
-
03_Faul simulation
-
04_Test generation
-
04_Test generation_animation
-
05_Testability Analysis
-
05_Testability Analysis
-
06_Design for testability
-
07_BIST
-
08_Memory testing
-
09_Board&System-level testing
-
104_2 SOC Testing Midterm_ref solution
-
104_2_SOC_Testing_Score
-
10_Fault-tolerant design
-
EX1 files
-
EX1_Fault simulation
-
EX2_ATPG
-
EX2_files
-
EX3_Scan-Insertion&ATPG
-
EX3_files
-
Exercise
-
Final Examination
-
Final Examination_ref
-
HW1_ref-sol
-
HW2_Ans
-
HW3_Ans
-
HW4_Ans
-
HW5_Ans
-
HW6_Ans
-
Midterm Examination_ref
-
Midterm_Score
Co-Instructor(s)
謝東佑
謝東佑
Co-Instructor(s)
王致皓
王致皓
Related Courses
|
|
||||||
|
|
|
||||||
|
|
|
||||||
|