1062_系統晶片測試
上課期間：從 2018-03-01 到 無限期
課程介紹
課程安排
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00_Overview
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01_Introduction
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02_Faul model
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03_Faul simulation
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04_Test generation
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04_Test generation_animation
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05_Testability Analysis
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05_Testability Analysis
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06_Design for testability
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07_BIST
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08_Memory testing
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EX1 files
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EX1_EX2_Failed
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EX1_Fault simulation
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EX1_Score
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EX2_ATPG
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EX2_Score
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EX2_files
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EX3_Testability Analysis
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EX3_files
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EX3_score
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EX4_Scan-Insertion&ATPG
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EX4_files
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EX4_score
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Final Examination_ref
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Final_Examination_score
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HW1_Ans
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HW1_Score
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HW2_Ans
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HW2_Score
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HW3_Ans
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HW3_Score
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HW4_Ans
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HW4_score
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Homework1
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Homework2
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Homework3
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Homework4
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Midterm Examination_ref
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Unit 6_exercise
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Unit 6_exercise_Ans
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Workstation-operation-flow
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score_summary
教師 / 謝東佑
教師 / 王致皓
教師 / 陳昭如
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