1062_SYSTEM-ON-CHIP TESTING
Course Period：From2018-03-01 ~ Any Time
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Course Intro

Course Plan

  • 00_Overview
  • 01_Introduction
  • 02_Faul model
  • 03_Faul simulation
  • 04_Test generation
  • 04_Test generation_animation
  • 05_Testability Analysis
  • 05_Testability Analysis
  • 06_Design for testability
  • 07_BIST
  • 08_Memory testing
  • EX1 files
  • EX1_EX2_Failed
  • EX1_Fault simulation
  • EX1_Score
  • EX2_ATPG
  • EX2_Score
  • EX2_files
  • EX3_Testability Analysis
  • EX3_files
  • EX3_score
  • EX4_Scan-Insertion&ATPG
  • EX4_files
  • EX4_score
  • Final Examination_ref
  • Final_Examination_score
  • HW1_Ans
  • HW1_Score
  • HW2_Ans
  • HW2_Score
  • HW3_Ans
  • HW3_Score
  • HW4_Ans
  • HW4_score
  • Homework1
  • Homework2
  • Homework3
  • Homework4
  • Midterm Examination_ref
  • Unit 6_exercise
  • Unit 6_exercise_Ans
  • Workstation-operation-flow
  • score_summary
Co-Instructor(s)
謝東佑
Co-Instructor(s)
王致皓
Co-Instructor(s)
陳昭如

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LINE sharing feature only supports mobile devices