1082_SYSTEM-ON-CHIP TESTING
Course Period：FromNow ~ Any Time
Course Intro
Course Plan
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00_Overview
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01_Introduction
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02_Faul model
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03_Faul simulation
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04_Test generation
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04_Test generation_animation
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05_Testability Analysis
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05_Testability Analysis
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06_Design for testability
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07_BIST
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08_Memory testing
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[Movie] Fault-sampling
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[Movie]TetraMax_Fault simulation
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[Movie] Workstation-tutorial
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EX1_Fault simulation
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EX2_ATPG
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EX3_Scan-Insertion&ATPG
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03-1_Introduction to Workstation Environment
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04_Test generation_animation
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Homework1
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Homework2
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Homework 3
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Homework4
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Ex-Homework1
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HW1成績
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HW1解答
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HW2解答
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Hw3成績
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Hw3解答
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Hw4成績
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Hw4解答
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Ex1上機成績(更新)
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Ex2上機成績(更新)
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Ex3上機成績
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Midterm Examination_ref
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EX1 files
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EX2_files
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EX3_files
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Final Examination_ref
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Bonus_Homework
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Bonus_Homework_Ans
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SOC Testing - 各項成績
Co-Instructor(s)
謝東佑
謝東佑
Co-Instructor(s)
鄭以狄
鄭以狄
Co-Instructor(s)
吳閏琮
吳閏琮
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