1101_系統晶片測試
報名期間：從 即日起 到 無限期
上課期間：從 即日起 到 無限期
課程介紹
課程安排
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00_Overview
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01_Introduction
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02_Faul model
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03_Faul simulation
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03-1_Introduction to Workstation Environment
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04_Test generation
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04_Test generation_animation
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05_Testability Analysis
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05_Testability Analysis_animation
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06_Design for testability
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07_BIST
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08_Memory testing
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目前加分狀況
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Homework1
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Homework2
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Homework3
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Homework4
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Homework5
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加分說明
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EX1_files
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EX1_Fault simulation_new
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EX2_files
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EX2_ATPG
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EX3_files
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EX3_Scan-InsertionATPG
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Homework1_sol
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Homework2_sol
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Homework3_sol
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Homework4_sol_v3
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Homework5_sol
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Zuvio_sol_v2
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Mentimeter_ATE_20211217
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Midterm Examination_ref
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期中參考解答
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Final Examination_ref
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成績確認
教師 / 謝東佑
教師 / 邱翔
教師 / 崔堡崴
教師 / 許嘉益
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